Wuhan Amber Stress Tech. (AST) specializes in X-ray diffraction (XRD) based residual stress analysis. We deliver precision measurement services to academic institutions, industrial enterprises, and R&D organizations, offering tailored solutions for diverse metallic materials and engineered components. Our commitment to scientific rigor ensures reliable residual stress characterization through customized testing protocols and advanced XRD methodologies.
Analytical Solutions:
1. Residual Stress Measurement Services
Compliance: ASTM E915, E2860, E1426 & SAE HS-784
Capabilities: Depth profiling | Stress tensor mapping | Multiaxial stress quantification
Methodologies: mono-wavelength (Cu, Cr, Mn) XRD with Ψ-γ goniometry
2. Retained Austenite & Microstructure Analysis
Standards: ASTM E975 | SAE SP-453
Advanced Protocols: Rietveld refinement crystallography | Carbide precipitation quantification
Supplementary: Martensite transformation kinetics modeling
3. Powder Diffraction Diagnostics
Core Services: Phase identification (ICDD PDF-4+ database) | Quantitative RIR analysis
Specialized: Nitride layer stoichiometry evaluation | Thin-film stress gradients
Featured Instrumentation: XL-640 X-Ray Stress Analyzer (Gen III) :
Next-generation stress analysis platform with ISO 17025-compliant operation
Key Advantages:
✓ On-site measurement capability for large components
✓ Automated ψ-axis collimator alignment
✓ Stress depth profiling via layer removal protocol
Deployment:
The XL-640 delivers laboratory-grade precision in portable field operations, backed by our ISO-certified global distribution network. Contact us to schedule a demonstration or request project-specific validation reports.
Application Cases:
Table of Crystal Structures, Radiation, Filters, Crystal Planes, and Diffraction Angles for Commonly Used Materials: